vault backup: 2023-12-12 14:13:01
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(Chapter 6, STAT 1040)
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(Chapter 6, STAT 1040)
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# Bias v. Chance Error
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# Bias v. Chance Error
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Bias affects all measurements the same way, making them all too large or too small.
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## Bias
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Bias *affects all measurements the same way, making them all too large or too small*. Bias is detected by comparing to an external standard.
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## Chance error
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Chance errors *change from measurement to measurement but average out over time*. There is no way to remove all chance errors from a measuring process. An example of chance error would be starting a stopwatch then attempting to stop it at exactly 5 seconds, then repeating. The times will vary, but each measurement will vary in a different way.
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